| AVS 55th International Symposium & Exhibition | |
| Biological, Organic, and Soft Materials Focus Topic | Wednesday Sessions |
| Session BO+AS+BI-WeA |
| Session: | Advances in Surface Analytical Methods for Organic and Biological Interfaces |
| Presenter: | H. Nygren, University of Gothenburg, Sweden |
| Authors: | H. Nygren, University of Gothenburg, Sweden P. Malmberg, University of Gothenburg, Sweden |
| Correspondent: | Click to Email |
Secondary ion mass spectrometry (SIMS) is based on the acceleration of primary ions onto a target. Secondary electrons, neutrals and ions are emitted from the target reflecting its chemical composition. SIMS is unique in its ability to detect simultaneously several target molecules in compound samples and to image their localization at subcellular resolution. The aim of the project is to develop the technology of imaging TOF-SIMS as a tool in biomedical research for analysis and localization of relevant target molecules e.g. inorganic ions, lipids, drugs, carbohydrates and proteins in the same sample. Recent research in TOF-SIMS has shown the distribution of a wide variety of compounds in biological tissue. The current issues in TOF-SIMS analysis are the data interpretation and identification of all new peaks detected with this technique. Until 2004, only a few high mass peaks of biological origin were identified, which leaves us in a situation where much of the interpretation of spectra remains to be done. The aim of this presentation is to define analyte molecules by mass spectra obtained using new primary ion sources with unique fragmentation properties. The possibility to detect proteins is of special interest. It is also an aim of the project to educate students in the analysis of cells and tissue with a high technology method as the research group is presently purchasing our own TOF-SIMS instrument.