| AVS 54th International Symposium | |
| In-situ Electron Microscopy Topical Conference | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | IE-MoA1 Invited Paper In-situ Environmental TEM of the Nucleation and Growth of One-Dimensional Nanostructures S. Takeda, H. Yoshida, Osaka University and CREST-JST, Japan, Y. Homma, Tokyo University of Science and CREST-JST, Japan |
| 2:40pm | IE-MoA3 Invited Paper Observation of Dynamic Nanoscale Processes Using Environmental Scanning Transmission Electron Microscope R. Sharma, Arizona State University |
| 3:40pm | IE-MoA6 Invited Paper Using Real Time Electron Microscopy to Understand Nucleation and Growth in Semiconducting Nanowires and Carbon Nanotubes E.A. Stach, B.-J. Kim, S.-M. Kim, D.M. Zakharov, Purdue University, F.M. Ross, J. Tersoff, IBM T.J. Watson Research Center, S. Kodambaka, UCLA, M.C. Reuter, K. Reuter, IBM T.J. Watson Research Center, B. Maruyama, M. Pender, Wright Patterson Air Force Research Laboratory |
| 4:20pm | IE-MoA8 Invited Paper In-situ Probing and Manipulation of Dynamical Processes on the Nanoscale using Combined Scanning Tunneling and Transmission Electron Microscopy E. Olsson, Chalmers University of Technology, Sweden |
| 5:00pm | IE-MoA10 High-Resolution In-Situ Electron Microscopy Studies of Aqueous Samples N. de Jonge, Oak Ridge National Laboratory, D.B. Peckys, University of Tennessee, Knoxville, G.M. Veith, Oak Ridge National Laboratory, S. Mick, Protochips Inc., D.W. Piston, Vanderbilt University, S.J. Pennycook, Oak Ridge National Laboratory, D.C. Joy, University of Tennessee, Knoxville |