| AVS 54th International Symposium | |
| Applied Surface Science | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | AS-MoA1 Invited Paper Cluster Primary Ion Beams Advance the Capability of Bio-Molecule Analysis by SIMS J.C. Vickerman, The University of Manchester, UK |
| 2:40pm | AS-MoA3 Detector Dead-time Effects in the Multivariate Analysis of ToF-SIMS Spectral Images M.R. Keenan, Sandia National Laboratories, V.S. Smentkowski, General Electric Global Research, J.A. Ohlhausen, Sandia National Laboratories |
| 3:00pm | AS-MoA4 Quantitative Nanoscale Analysis of Surfaces with Topography using ToF-SIMS J.L.S. Lee, I.S. Gilmore, M.P. Seah, National Physical Laboratory, UK |
| 3:40pm | AS-MoA6 Invited Paper Cluster Primary Ions: Spikes, Sputtering Yields, Secondary Ion Yields and Inter-Relationships for Secondary Molecular Ions for Static SIMS M.P. Seah, National Physical Laboratory, UK |
| 4:20pm | AS-MoA8 Invited Paper The 3D Atom Probe Instrument - Introduction to the Technique and Some Applications in Material Science L. Renaud, CAMECA, France |
| 5:00pm | AS-MoA10 Composition of Surfaces: A Comparison of LEIS and ToF-SIMS D. Breitenstein, R. Kersting, B. Hagenhoff, Tascon GmbH, Germany, R. ter Veen, H. Brongersma, Calipso B.V., The Netherlands |