AVS 54th International Symposium
    Tribology Wednesday Sessions
       Session TR1+MN-WeA

Invited Paper TR1+MN-WeA8
MEMS Reliability in Harsh Environments

Wednesday, October 17, 2007, 4:00 pm, Room 617

Session: Surfaces and Interfaces in MEMS
Presenter: R. Maboudian, University of California at Berkeley
Authors: R. Maboudian, University of California at Berkeley
C. Carraro, University of California at Berkeley
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Many applications require sensors and actuators that can survive harsh environments, including high temperature and high relative humidity. This presentation will examine the behavior of polycrystalline silicon based micro-electromechanical systems in a variety of harsh environments. Then, the effectiveness of self-assembled monolayers and silicon carbide for enhanced MEMS reliability under these conditions will be discussed.