AVS 54th International Symposium
    Surface Science Monday Sessions
       Session SS2-MoA

Paper SS2-MoA10
Intrinsic Accumulation Layer Quantum Well States and Anomalous Valence Band Dispersion in Indium Nitride

Monday, October 15, 2007, 5:00 pm, Room 611

Session: Electronic and Vibrational Structure
Presenter: K.E. Smith, Boston University
Authors: K.E. Smith, Boston University
L. Colakerol, Boston University
T. Learmonth, Boston University
P.A. Glans, Boston University
L.F.J. Piper, Boston University
A. Fedorov, Lawrence Berkeley National Laboratory
T.D. Veal, University of Warwick, UK
C.F. McConville, University of Warwick, UK
S. Healy, University College Cork, Ireland
E.P. O'Reilly, University College Cork, Ireland
T.C. Chen, Boston University
T.D. Moustakas, Boston University
Correspondent: Click to Email

The valence and conduction band electronic structure in InN thin films has been measured using high resolution Angle Resolved Photoemission Spectroscopy (ARPES). InN exhibits an accumulation layer near the film surface, and our ARPES measurements reveal that the conduction band electrons in the accumulation layer exist in intrinsic quantum well states.1 We also used ARPES to measure the Fermi surface of these quantum well states, as well as their constant binding energy contours below the Fermi level. The energy of the Fermi level, and the size of the Fermi surface for these quantum well states could be controlled by varying the method of surface preparation. Furthermore, a minimum is observed in the dispersion of the top of the valence band, with the highest measured valence band having an electron-like dispersion at the Brillouin zone center, which is unexpected in the context of earlier measurements and calculations. Valence band holes see a quantum barrier near the surface, and a theoretical analysis using a k.p approach of the influence of this barrier indicates that the anomalous dispersion is most likely due to a negative crystal field splitting in InN, contrary to previous expectations. This work was supported in part by the DOE under RF-06-PRD-001 (subcontract from University of Nevada, Las Vegas), by the NSF under grant number DMR-0311792, and by Science Foundation Ireland. The ALS is supported by the DOE, Materials Sciences Division under contract no. DE-AC03-76SF00098.

1 1. L. Colakerol, T.D. Veal, H.-K. Jeong, L. Plukinski, A. DeMasi, S. Wang, Y. Zhang, L.F.J. Piper, P.H. Jefferson, A. Fedorov, T.C. Chen, T. D. Moustakas, C.F. McConville, and K.E. Smith, Phys. Rev. Lett. 97, 237601 (2006).