| AVS 54th International Symposium | |
| Surface Science | Thursday Sessions |
| Session SS-ThP |
| Session: | Surface Science Poster Session |
| Presenter: | A. Amassian, Cornell University |
| Authors: | A. Amassian, Cornell University V.A. Pozdin, Cornell University S. Bhargava, Cornell University D.-M. Smilgies, CHESS, Cornell University A. Papadimitratos, Cornell University S. Hong, Cornell University A.R. Woll, CHESS, Cornell University G.G. Malliaras, Cornell University J.R. Engstrom, Cornell University |
| Correspondent: | Click to Email |
We have performed in situ, real-time grazing incidence X-ray synchrotron measurements during the growth of organic thin films of pentacene. Experiments were carried out on films deposited from both thermal and supersonic sources on a variety of substrates (e.g., SiO2, photoresists, polymers) and over a broad range of process parameters (e.g., growth rate, temperature, beam kinetic energy). A CCD detector captured both in-plane Bragg peaks and out-of-plane Bragg sheets, allowing us to solve the 3D structure of pentacene crystals. We reveal the formation of new polymorphs of the so-called "thin film" and bulk phases of pentacene, while in situ measurements (video to be shown)provide new insights into the initial growth of organic crystals.