| AVS 54th International Symposium | |
| Surface Science | Thursday Sessions |
| Session SS-ThP |
| Session: | Surface Science Poster Session |
| Presenter: | S. Suzer, Bilkent University, Turkey |
| Authors: | S. Suzer, Bilkent University, Turkey H. Sezen, Bilkent University, Turkey G. Ertas, Bilkent University, Turkey A. Dana, Bilkent University, Turkey |
| Correspondent: | Click to Email |
A new technique is introduced for probing charging/discharging dynamics of dielectric materials, in which X-ray photoemission data is recorded while the sample rod is subjected to 10.0 V square-wave pulses with varying frequencies in the range of 0.001 to 1000 Hz. This technique allows us to probe electrical impedance of dielectric materials. Accordingly, for a conducting graphite sample the C1s peak appears at correspondingly -10.0 eV and +10.0 eV binding energy positions (20.0 eV difference) with no frequency dependence. However, the corresponding C1s and O1s peaks of polymeric materials (PS, PMMA, and PS/PMMA blends) appear with less than 20.0 eV difference and exhibit strong frequency dependence due to charging of the polymeric films, which are faithfully reproduced by a theoretical model.1,2 Information can be obtained from the frequency dependence of the positions, as well as the widths of the peaks. Various applications of this technique for characterization of organic (polymeric) and inorganic homogeneous and heterogeneous materials and surface structures will be presented and discussed.
1S. Suzer, and A. Dana, J. Phys. Chem. B 110, 19122 (2006).
2H. H. Sezen, G. Ertas, A. Dana, and S. Suzer, Macromolecules (in press).