| AVS 54th International Symposium | |
| Nanometer-scale Science and Technology | Tuesday Sessions |
| Session NS-TuP |
| Session: | Nanometer-scale Science and Technology Poster Session I |
| Presenter: | M.P. Delplancke-Ogletree, Universite Libre de Bruxelles, Belgium |
| Authors: | E. Tam, Universite Libre de Bruxelles, Belgium P. Berke, Universite Libre de Bruxelles, Belgium T.J. Massart, Universite Libre de Bruxelles, Belgium M.P. Delplancke-Ogletree, Universite Libre de Bruxelles, Belgium |
| Correspondent: | Click to Email |
Rate dependent nano-indentation experiments have been performed on pure polycrystalline nickel and titanium and also on anodized titanium samples. During indentation, the load is linearly increased, then held constant for various intervals of time then reduced linearly to zero. The extent of "creep", sample displacement at constant load, varies with the loading rate. Finite element calculations have been performed to model these experiments. Using time independent material properties, the slope of the loading curve is significantly underestimated. When rate-dependent material properties are used in the model calculations accurate load slopes and creep behavior are obtained. Additional experiments have been carried out to analyse the effect of sample roughness and indentation depth. Implications for determination of material properties trough nano-indentation will be discussed.