| AVS 54th International Symposium | |
| Nanometer-scale Science and Technology | Tuesday Sessions |
| Session NS-TuP |
| Session: | Nanometer-scale Science and Technology Poster Session I |
| Presenter: | S. Takemura, Kanto Gakuin University, Japan |
| Authors: | H. Kato, Kanto Gakuin University, Japan S. Takemura, Kanto Gakuin University, Japan A. Ishii, Kanto Gakuin University, Japan Y. Takarai, Kanto Gakuin University, Japan Y. Watanabe, Kanto Gakuin University, Japan T. Sugiyama, Kanto Gakuin University, Japan T. Hiramatsu, Kanto Gakuin University, Japan N. Nanba, Kanto Gakuin University, Japan O. Nishikawa, Kanazawa Institute of Technology, Japan M. Taniguchi, Kanazawa Institute of Technology, Japan |
| Correspondent: | Click to Email |
A nanoscale linked crater structure was fabricated on an Al surface by wet chemical and electrochemical processes. The surface of an Al plate was treated with Semi Clean and Semico Clean in order to create crater-shaped erosion on the surface. The successive electrochemical anodization in H2SO4 solution created a nanoscale finer linked-crater structure on the surface. The authors conducted the nanofilm growth of conducting polymer polythiophene on the nanoscale structured Al surface by the electrochemical polymerization method. The electrochemical polymerization was performed in acetonitrile containing thiophene monomer and (Et)4NBF4 as a supporting electrolyte and the polymerization on the linked-crater surface was conducted by applying positive voltage to the Al plate. The dynamic force microscopy (DFM) image of the Al surface after the polymerization process suggested that the polymer was grown on the nanoscale linked-crater structure. In the DFM measurements, the dimmer contour image of each crater was still recognized even after the polymerization process was fulfilled suggesting that the polymer film was grown on the Al surface. The cross section analysis of the DFM measurement demonstrated that the nanofilm was grown on the linked crater because the crater depth became shallow. X-ray photoemission spectroscopy (XPS) measurement also supported the polymer growth because C 1s and F 1s due to the polymer origin were detected. Furthermore, the authors tried to inject copper phthalocyanine (CuPc) molecules into the polythiophene nanofilm on the nanoscale structured Al in order to functionalize the nanoscale hybrid materials. The XPS measurement detected C 1s, N 1s and Cu 2p lines due to the injected CuPc molecules. This work was supported by High-Tech Research Center Project aided by MEXT.