AVS 54th International Symposium
    Nanometer-scale Science and Technology Wednesday Sessions
       Session NS+EM-WeM

Paper NS+EM-WeM11
Electrical and Mechanical Characterization of Nanowire Properties using In-Situ SEM

Wednesday, October 17, 2007, 11:20 am, Room 616

Session: Nanoscale Devices and Nanowires I
Presenter: D.F. Ogletree, Lawrence Berkeley National Laboratory
Correspondent: Click to Email

Nanowires have unique electrical and mechanical properties with a wide range of potential applications in electronics, opto-electronics and nano-mechanics. Local measurements of the electrical and mechanical properties of individual nanowires in controlled environments are required to develop these applications and to optimize nanowire growth conditions. A flexible system for nanowire characterization based on a high-resolution environmental scanning electron microscope (SEM) has been developed combining sample heating in controlled gas environments with nano-positioning of local probes. This system has been used to investigate the evolution of size-dependent nanowire mechanical properties between room temperature and the melting point of the nanowires.