Paper EW-WeL5
Recent Developments: STM 150 Aarhus and FE-LEEM P90

Wednesday, October 17, 2007, 1:40 pm, Room Exhibit Hall

SPECS has developed a new temperature design for the original STM 150 Aarhus system. Excellent performance in terms of mechanical stability and thermal control could be demonstrated for LN2 temperatures and temperatures exceeding 1000°C up to 1200°C. The high temperature performance of the new design is demonstrated using first results of a Si(111) sample in a FE-LEEM P90 sample holder. Atomically resolved phase transitions of the (7x7) <-> (1x1) surface reconstruction could be observed easily. The FE-LEEM P90 is a next generation Low Energy Electron Microscope with unsurpassed resolution for dynamic LEEM microscopy experiments. With this instrument, based on the design of Dr. Rudolf Tromp, nanometer scale processes on surfaces can be observed in real-time. The instrument can be upgraded with an electron mirror for aberration correction, The design resolution for the corrected FE-LEEM P90 is below 2nm.