| AVS 54th International Symposium | |
| Exhibitor Workshops | Tuesday Sessions |
| Session EW-TuB |
| Session: | Exhibitor Workshops |
| Presenter: | J. Li, Asylum Research |
| Authors: | R. Proksch, Asylum Research D. Bocek, Asylum Research C. Callahan, Asylum Research J. Cleveland, Asylum Research T. Day, Asylum Research J. Li, Asylum Research A. Moshar, Asylum Research |
| Correspondent: | Click to Email |
In a new AFM imaging technique, Dual AC Mode, the cantilever is driven at or near two of its resonant vibrational modes. For commercially-available cantilevers, these resonant modes are not harmonic. The amplitude and phase signals measured at the different frequencies show very different contrast on a variety of samples.1 The workshop will discuss how Dual AC mode works and show application examples of Dual AC on magnetic samples, material and bio samples. In addition to images of a variety of samples, we will also discuss amplitude and phase vs. the tip sample distance curves which further elucidates the physics of the contrast formation.
1R. Proksch. Multifrequency, repulsive-mode amplitude-modulated atomic force microscopy. Applied Physics Letters 89, p. 113121, (2006).