AVS 54th International Symposium | |
Renewable Energy Science & Technology Topical Conference | Thursday Sessions |
Session EN+SS+TF-ThM |
Session: | Surface Science Challenges for Solar Energy Conversion |
Presenter: | A. Rockett, University of Illinois |
Authors: | M. Mayer, University of Illinois L. Ruppalt, University of Illinois J. Lyding, University of Illinois A. Rockett, University of Illinois |
Correspondent: | Click to Email |
Results of the characterization of the surface physical, chemical and energy band structure of CuInSe2 (CIS) are reported based on scanning tunneling microscopy (STM) studies of epitaxial CIS thin films. Cu(In, Ga)Se2 (CIGS) is the absorber layer in the highest efficiency thin-film solar cells. However, this material does not perform as well as expected, most likely due to local defects and composition fluctuations. These lead to the formation of electronic defect levels in the energy gap and band edge fluctuations, both of which can cause carrier recombination. STM images compare the structure of cleaved (110) type surfaces, which have been shown previously to be energetically unstable, with epitaxial layers of various stable surface orientations that had been cleaned by sputtering and annealing. The energetically favorable close-packed tetragonal (112) surface showed triangular facets in agreement with AFM and SEM images. The (110) face showed structural and chemical correlations with the local density of states and evidence of a Cu-deficient surface consisting of extended In-rich rows. The surface structure of the cleaved surface is consistent with suggestions that the surfaces of group III rich CIGS should be highly In-rich and should contain Cu vacancies. No significant reconstruction associated with the Se sublattice was observed. The local density of states obtained from tunneling spectroscopy exhibited large fluctuations in the energy gap and Fermi energy, providing direct evidence of the band edge fluctuations observed by photoluminescence. The gap fluctuations are correlated with the surface topography and have direct implications for the device performances.