AVS 54th International Symposium
    Renewable Energy Science & Technology Topical Conference Thursday Sessions
       Session EN+SS+TF-ThM

Paper EN+SS+TF-ThM9
Surface Nanostructure and Nanochemistry of CuInSe2 by Scanning Tunneling Microscopy

Thursday, October 18, 2007, 10:40 am, Room 602/603

Session: Surface Science Challenges for Solar Energy Conversion
Presenter: A. Rockett, University of Illinois
Authors: M. Mayer, University of Illinois
L. Ruppalt, University of Illinois
J. Lyding, University of Illinois
A. Rockett, University of Illinois
Correspondent: Click to Email

Results of the characterization of the surface physical, chemical and energy band structure of CuInSe2 (CIS) are reported based on scanning tunneling microscopy (STM) studies of epitaxial CIS thin films. Cu(In, Ga)Se2 (CIGS) is the absorber layer in the highest efficiency thin-film solar cells. However, this material does not perform as well as expected, most likely due to local defects and composition fluctuations. These lead to the formation of electronic defect levels in the energy gap and band edge fluctuations, both of which can cause carrier recombination. STM images compare the structure of cleaved (110) type surfaces, which have been shown previously to be energetically unstable, with epitaxial layers of various stable surface orientations that had been cleaned by sputtering and annealing. The energetically favorable close-packed tetragonal (112) surface showed triangular facets in agreement with AFM and SEM images. The (110) face showed structural and chemical correlations with the local density of states and evidence of a Cu-deficient surface consisting of extended In-rich rows. The surface structure of the cleaved surface is consistent with suggestions that the surfaces of group III rich CIGS should be highly In-rich and should contain Cu vacancies. No significant reconstruction associated with the Se sublattice was observed. The local density of states obtained from tunneling spectroscopy exhibited large fluctuations in the energy gap and Fermi energy, providing direct evidence of the band edge fluctuations observed by photoluminescence. The gap fluctuations are correlated with the surface topography and have direct implications for the device performances.