|AVS 54th International Symposium|
|Applied Surface Science||Tuesday Sessions|
|Session:||Aspects of Applied Surface Science Poster Session|
|Presenter:||Y. Hou, University of Leoben, Austria|
|Authors:||Y. Hou, University of Leoben, Austria
A. Andreev, University of Leoben, Austria
C. Teichert, University of Leoben, Austria
G. Brauer, Forschungszentrum Dresden-Rossendorf, Germany
A. Djurisic, University of Hong Kong, P.R. China
|Correspondent:||Click to Email|
Solar cells made from an array of high-quality vertical ZnO nanorods filled with a light-absorbing, hole conducting polymer are promising devices for efficient low-cost solar energy conversion.1 However, achieving full control over the growth of such nanostructures leading to proper dimensional confinement (like nanorod diameter, length, density and orientation) is still a challenging task. On the other hand, Atomic Force Microscopy (AFM) is well known as a valuable tool for nanometer scale characterization of different types of nanostructures.2 The capabilities of AFM technique are demonstrated for the characterization of vertical arrays of various ZnO nanorods.3 In detail, the topography of the ZnO nanorods grown on Si and ITO substrates was examined. It was found that tapping mode AFM is an appropriate tool to reveal the morphological features of vertical ZnO nanorods on the nanoscale, i.e. 3D rod shape, lateral size, average height and rod height uniformity. The results are compared with those obtained by Scanning Electron Microscopy. Moreover, by cross-sectional AFM measurements it was also established that intermediate facets appear between the top (0001) and side facets. Further, polymer coated ZnO nanorods have been investigated by AFM.
1 E. Greene, et al., Nano Lett. 5 (2005) 1231-1236.
2 C. Teichert, Phys. Rep. 365 (2002) 335-432.
3 G. Brauer, W. Anwand, D. Grambole, W. Skorupa, Y. Hou, A. Andreev, C. Teichert, K. H. Tam, A.B. Djurišic, Nanotechnology 18 (2007) 195301-1-8.