AVS 51st International Symposium
    Nanometer-scale Science and Technology Monday Sessions
       Session NS-MoM

Paper NS-MoM2
Quantitative Analysis of Electronic Properties of Carbon Nanotubes by Scanning Probe Microscopy: from Atomic to Mesoscopic Length Scales

Monday, November 15, 2004, 8:40 am, Room 213D

Session: Carbon Nanotubes-Electrical Properties
Presenter: V. Meunier, Oak Ridge National Laboratory
Authors: V. Meunier, Oak Ridge National Laboratory
S.V. Kalinin, Oak Ridge National Laboratory
J. Shin, Oak Ridge National Laboratory
A.P. Baddorf, Oak Ridge National Laboratory
R.J. Harrison, Oak Ridge National Laboratory
Correspondent: Click to Email
Scanning Probe Microscopy techniques are the key to real space imaging of electronic transport properties, including the electrostatic potential distribution and local field effects, in low-dimensional systems. The interpretation of SPM data in terms of the local electronic properties of 1D systems such as carbon nanotubes requires quantitative analysis of the tip-nanotube interactions. Here, the electrostatic interactions between a point charge and a carbon nanotube are studied using a combination of first principles density functional calculations and continuum electrostatics modeling. The atomistic first principles investigation is extended to mesoscopic length scales by matching to a continuum electrostatic approach. Furthermore, realistic tip shape effects are included using an image charge model. An approach for the measurement of tip radius of curvature from the electrostatic SPM data is presented. Within this approach, we can quantitatively describe, for the first time, the capacitive tip-surface interactions and predict the magnitude of the tip gate effect in nanoscale systems, such as carbon nanotubes and semiconductor nanowires.