AVS 51st International Symposium
    Electronic Materials and Processing Tuesday Sessions
       Session EM-TuA

Paper EM-TuA1
Spectroscopic & Microscopic Characterization of Multi-layered Superconducting Thin Films

Tuesday, November 16, 2004, 1:20 pm, Room 304B

Session: Defects and Interfaces in Electronic Materials and Devices
Presenter: S. Vemulakonda, Wright State University
Authors: S.M. Mukhopadhyay, Wright State University
S. Krishnaswami, Wright State University
S. Vemulakonda, Wright State University
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Correlation of chemical composition profile, microstructure & electrical properties of thin film superconductors will be presented in this talk. Studies have been performed to compare the chemical and compositional profiles, grain texture and critical current densities of Y-Ba-Cu-Oxide layers grown by PLD and MOCVD on single crystals and on polycrystalline metal substrates and different buffer (diffusion barrier) layers. X-ray Photoelectron Spectroscopy (XPS) has been used in conjunction with ion beam sputtering to obtain composition and chemistry information at different depths into the film. It is seen that variations in overall composition such as cationic ratios and diffusion of buffer layer species can occur in some types of film. MOCVD samples grown on IBAD textured buffer layers have higher copper concentration that may be linked to higher grain boundary content. Some films grown on polycrystalline metal-substrates (buffered with YSZ and CeO2) show Zr diffusion into the YBCO region whereas those grown on single crystal YSZ (buffered with CeO2) do not. The durability and stability of these films, and their dependence on starting microstructures has been compared and will be presented.