AVS 51st International Symposium
    Applied Surface Science Tuesday Sessions
       Session AS-TuM

Paper AS-TuM2
Validation of Information Gained from the XPS Survey Scan

Tuesday, November 16, 2004, 8:40 am, Room 210A

Session: Electron Spectroscopies
Presenter: J.E. Castle, University of Surrey, UK
Authors: J.E. Castle, University of Surrey, UK
C. Lavie-Compin, University of Surrey, UK
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Members of the 34th IUVSTA workshop @footnote1@ reported an â?oimplementable protocol for the collection and analysis of a standard survey scan; allowing extraction of the maximum available informationâ?. This information might then guide the next steps in sample analysis or might be sufficient in itself. Autonomous extraction of information required in corrosion science has been discussed @footnote2@. Here we compare data obtained from the survey scan with high resolution scans for four Cu/Ni alloys. They were examined: a) ion-etched ; b) carrying the air-formed oxide and contamination; c) after oxidation in air at 100ºC; and d) as c) with a brief ion-etch. The survey scan was used to determine key data including: a) testing for adventitious contamination by organic molecules @footnote3@; b) the thickness of the contamination layer; c) the apparent surface composition, corrected for the influence of contamination; d) the surface enrichment factor and enrichment rank; e) the principle chemical species in the surface, determined by the Auger parameter, and/or the presence of satellites @footnote4@; f) the thickness of the oxide, determined by peak fitting regions taken from the survey scan. The comparison enables the value of guidance given by the survey scan and the extent to which it is sufficient for purpose, to be assessed. @FootnoteText@ @footnote1@ J.E.Castle and C.J.Powell â?oReport on the 34th IUVSTA Workshop â?~XPS: from spectra to results â?" towards an expert systemâ? Surf.Interface Anal. 36 pp225 - 37 (2004) @footnote2@ J.E.Castle â?oModules for an XPS Expert System: Applications in Corrosion Scienceâ?, QSA Symposium: AVS 50th Meeting, Baltimore 2003. @footnote3@ J.E.Castle and M.A.Bakerâ?oThe Feasibility of an XPS Expert System Demonstrated by A Rule Set for Carbon Contaminationâ? J. Elec Spec & Related Phenomena, 105 pp245 - 256 (1999) @footnote4@ J.E.Castle â?~A Wizard Source of Expertise in XPSâ?T Surf.Interface Anal. 33 pp 196 - 202 (2002).