AVS 51st International Symposium
    Applied Surface Science Monday Sessions
       Session AS-MoP

Paper AS-MoP4
Using ToF-SIMS as a High Throughput Screening Tool for Lightweight Hydrogen Storage Materials

Monday, November 15, 2004, 5:00 pm, Room Exhibit Hall B

Session: Poster Session
Presenter: J.P. Lemmon, General Electric Global Research Center
Authors: J.P. Lemmon, General Electric Global Research Center
J.-C. Zhao, General Electric Global Research Center
V.S. Smentkowski, General Electric Global Research Center
Correspondent: Click to Email
Combinatorial Chemistry (CC) coupled with High-Throughput Screening (HTS) techniques are being used at the General Electric Global Research Center to generate and characterize multi-component samples in order to accelerate the discovery of new hydrogen storage materials for automotive applications. In order to meet the DoE target of 6 weight percent hydrogen by the year 2010, the hydrogen storage material must contain low Z (low weight) components. Low Z elements can not be detected using techniques that rely on X-ray generation, such as Electron Probe Microanalysis (EPMA) and/or X-Ray Fluorescence (XRF). ToF-SIMS is ideally suited for the rapid screening of low Z materials since it allows for the detection of all elements and can also image large areas (eg. 70mm x 70mm) in less than 2 hours. ToF-SIMS images can be measured while the combinatorial chemistry library is being heated and/or maintained at the desired temperature in the range of 100 to 600° C. Temperature programmed ToF-SIMS experiments will be used to measure the hydrogen desorption processes of combinatorial chemistry libraries. Select examples will be presented.