AVS 51st International Symposium
    Applied Surface Science Monday Sessions
       Session AS-MoP

Paper AS-MoP24
XPS Analysis Under External Stimuli

Monday, November 15, 2004, 5:00 pm, Room Exhibit Hall B

Session: Poster Session
Presenter: S. Suzer, Bilkent University, Turkey
Authors: S. Suzer, Bilkent University, Turkey
U.K. Demirok, Bilkent University, Turkey
G. Ertas, Bilkent University, Turkey
Correspondent: Click to Email
Earlier, we demonstrated that, by applying external voltage bias to the sample rod while recording XPS spectra, it was possible to influence the measured binding energy differences by controlling the partial charging/discharging of different surface layers or domains either by electrons created from a filament, or by stray electrons within the vacuum system stemming form X-ray tube, vacuum gauges, etc.[1, 2]. We had used this to separate otherwise overlapping XPS peaks belonging to different surface features.[3] Later, we expanded it to extract time-dependent information. [4] In this contribution, we will present our extended investigation of different surface structures like Au nanoclusters deposited on SiO2 substrates or thin organic layers of various thickness, etc., using different external voltage stimuli over other external elements like resistors, capacitors for extracting information related with the dielectric properties of surface structures and probing nanocluster-surface interactions. @FootnoteText@ [1] B. Ulgut, and S. Suzer, J. Phys. Chem. B 107, 2939 (2003). [2] F. Karadas, G. Ertas, and S. Suzer, J. Phys. Chem. B 108, 1515 (2004). [3] S. Suzer, Anal. Chem. 75, 7026 (2003). [4] U. K. Demirok, G. Ertas, and S. Suzer, J. Phys. Chem. B 108, 5179 (2004).