AVS 51st International Symposium
    Applied Surface Science Monday Sessions
       Session AS-MoP

Paper AS-MoP14
XPS, AFM, and Confocal Microscopy Data Correlation: Characterization of Polymer Blend Systems to Create a 3D Volume

Monday, November 15, 2004, 5:00 pm, Room Exhibit Hall B

Session: Poster Session
Presenter: J.L. Fenton, The University of New Mexico
Authors: J.L. Fenton, The University of New Mexico
K. Artyushkova, The University of New Mexico
J. Farrar, The University of New Mexico
J.E. Fulghum, The University of New Mexico
Correspondent: Click to Email
No single non-destructive technique readily provides both surface chemistry and component distribution through the depth of polymer samples. Visualization based upon multiple analytical characterization techniques can be used to create a 3-D map of polymer chemistry. This work combine data from XPS, AFM, and confocal microscopy analysis of polyvinylchloride/polymethylmethacrylate and polystyrene/polybutadiene blends. Confocal microscopy images are used to create a volume that can be correlated with XPS images and spectra in order to semi-quantitatively map the distribution of chemical components within the blends. The correlated data will be combined with AFM images to incorporate surface topography measurements. This work has been partially supported by NSF CHE-0113724 and the NSF IGERT CORE program.