AVS 51st International Symposium
    Applied Surface Science Monday Sessions
       Session AS-MoM

Paper AS-MoM1
Application of TOF-SIMS to Environmentally Relevant Surface and Interfaces

Monday, November 15, 2004, 8:20 am, Room 210A

Session: SIMS I - Cluster Probe Beams and General Topics
Presenter: D.J. Gaspar, Pacific Northwest National Laboratory
Authors: D.J. Gaspar, Pacific Northwest National Laboratory
A. Laskin, Pacific Northwest National Laboratory
B.J. Finlayson-Pitts, University of California, Irvine
B.M. Sass, Battelle Memorial Institute
Correspondent: Click to Email
TOF-SIMS analysis is an invaluable tool for analysis of environmentally relevant samples. The molecular identity and distribution of surface species can be essential in understanding environmental samples. In the Environmental and Molecular Sciences Laboratory, we have applied TOF-SIMS analysis to problems in atmospheric and environmental chemistry. Some examples presented here include: identification and measurement of fatty acids on aerosol particles, measurement of extent of reaction between NaCl and hydroxyl radicals,@footnote 1@@super ,@ @footnote 2@ investigation of the interaction between glass and gaseous nitric acid,@footnote 3@ and determination of heavy metal distributions in weathered, pressure-treated wood. In the first example, fatty acids were identified on field collected atmospheric aerosols as a function of time. Next, hydroxyl radicals were found to reacted with NaCl particles in the laboratory to produce basic species, while in the third example, the reaction products of gaseous nitric acid and borosilicate glass were determined to segregate on the glass surface in precipitates according to solubility. Finally, the distribution of copper, chromium and arsenic, as well as other metals, were measured in pressure treated wood after extended weathering. Each of these examples demonstrates the utility of TOF-SIMS in identifying species and determining distributions on environmentally relevant surfaces. @FootnoteText@ @footnote 1@ D.J. Gaspar, A. Laskin, W. Wang, S.W. Hunt, and B.J. Finlayson-Pitts. Applied Surface Science, in press, 2004.@footnote 2@ A. Laskin, D.J. Gaspar, W.H. Wang, S.W. Hunt, J.P. Cowin, S.D. Colson, B.J. Finlayson-Pitts. Science, 301 (2003) 340-344,"@footnote 3@ Y. Dubowski, A. L. Sumner, E. J. Menke, D. J. Gaspar, J. T. Newberg, R. C. Hoffman, R. M. Penner, J. C. Hemminger and B. J. Finlayson-Pitts. Physical Chemistry Chemical Physics, in press, 2004.