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Deadlines

Housing: September 18, 2007
Symposium: September 24, 2007

 


technical program

Symposium Registration & Fees


Registration form is also downloadable in Adobe pdf format for those who choose not to register online or chose to pay by check


Washington State Convention Center
800 Convention Place
 Seattle, WA

Registration Type On-Site Registration
(After 09/24/07)
Member $530.00
Non-Member $630.00
Post-Doc Member $275.00
Post-Doc Non-Member $325.00
Student Member $95.00
Student Non-Member $105.00
One Day $275.00
Exhibits Only Free Admission

 

select the appropriate button below to register as:

Register as an AVS member and receive discounted member rate

Register as an AVS member and pay your 2008 membership dues in one transaction.

Register as an AVS non-member


If you have already registered for the AVS 54th International Symposium and would like to update your registration information, please click here.  You will need your last name and registration confirmation number.

Due to increasing delays in securing visas to the U.S. it is strongly encouraged that perspective international attendees begin this process as early as possible to ensure approval. Please refer to the following website for additional information and assistance: http://www.national-academies.org/visas

 


MAJOR Symposium Sponsors
Ambios manufactures high performance, state-of-the-art, surface metrology equipment for industrial and academic researchers.  Product line includes  stylus profilometers, non-contact optical profilers, and  AFM and SPM instruments. JEOL manufactures a full line of surface analysis instrumentation including ultra high resolution TEMs for elemental analysis in sub-micron areas; scanning Auger Microprobes; ultra high resolution, low voltage, field emission SEMs and UHV SEMs; and UHV-STM’s featuring a high temperature sample heating stage. Kratos Analytical will exhibit its line of high performance XPS multi-technique spectrometers designed for R&D applications. The AXIS Ultra provides the latest in spectroscopic and imaging capabilities with analytical flexibility. Also being exhibited is the AXIS Nova, an automated XPS instrument combining research level performance with automation and high throughput. NREL's mission and strategy are focused on advancing the U.S. Department of Energy's and our nation's energy goals. The laboratory's scientists and researchers support critical market objectives to accelerate research from scientific innovations to market-viable alternative energy solutions.
OMICRON NanoTechnology is the premier supplier of UHV instruments for nanoscience-related research. We invite you to visit our booth to see the latest results from the next generation Low Temperature (down to 4K) Atomic Force Microscope with enhanced LHe hold time. The Variable Temperature AFM/STM is now available with a non-optical force sensor. We will also be highlighting the ESCA+, NanoESCA and NanoSAM surface science systems. From thin film development to characterization, Omicron can help. Physical Electronics (PHI) is a subsidiary of ULVAC-PHI, the world's leading supplier of surface analysis instrumentation.  PHI’s innovative AES, XPS, and SIMS instruments are used to accelerate the development of advanced materials for a broad range of high technology applications. Thermo Electron Corporation will display the new K-Alpha Materials Characterization instrument. Using X-ray Photoelectron Spectroscopy (XPS), the K-Alpha enables rapid, accurate and cost-effective quantitative monitoring of the surface chemical composition of the top few nanometers of solid materials including insulators, semiconductors and metals for materials researchers as well as the emerging biotech, nanotech and pharmaceutical industries Vacuum Research Ltd: Manufacturer for 50 years of a broad line of high vacuum valves. Throttle valves, poppet style valves, rectangular port valves, and gate valves from ISO-63 to ISO-630.  Valves with ANSI and JIS flanges in similar sizes.