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Deadlines
Housing: September 18, 2007
Symposium: September 24, 2007

 

 

technical program

AVS Fellows

The membership level designated “Fellow of the Society” was established in 1993 to recognize members who have made sustained and outstanding scientific and technical contributions in areas of interest to AVS. These contributions can be in research, engineering, technical advancement, academic education or managerial leadership. This is a prestigious membership level to which members are elected. AVS Fellows receive a certificate.

2007 AVS FELLOWS

  • Paul Arnold, Brooks Automation, Granville-Phillips Product Ctr.

  • Peter A. Dowben, University of Nebraska

  • Calvin T. Gabriel, Spansion, Inc.

  • Joseph D. Geller, Geller Microanalytical Laboratory

  • James J. Hickman, University of Central Florida

  • C. Mathew Mate, Hitachi Global Storage Technologies

  • Meyya Meyyappan, NASA Ames Research Center

  • Ralph Nuzzo, University of Illinois at Urbana-Champaign

  • David Ruzic, University of Illinois

  • Bruce D. Sartwell, Naval Research Laboratory

  • Karen L. Seaward, Agilent Laboratories

  • Kevin E. Smith, Boston University

  • Bruce D. Terris, Hitachi Global Storage Technologies

  • Richard (M.C.M) van de Sanden, Eindhoven University of Technology

  • Robert M. Wallace, University of Texas at Dallas

  • Paul S. Weiss, Pennsylvania State University

MAJOR Symposium Sponsors
Ambios manufactures high performance, state-of-the-art, surface metrology equipment for industrial and academic researchers. Product line includes stylus profilometers, non-contact optical profilers, and AFM and SPM instruments. JEOL manufactures a full line of surface analysis instrumentation including ultra high resolution TEMs for elemental analysis in sub-micron areas; scanning Auger Microprobes; ultra high resolution, low voltage, field emission SEMs and UHV SEMs; and UHV-STM’s featuring a high temperature sample heating stage. Kratos Analytical will exhibit its line of high performance XPS multi-technique spectrometers designed for R&D applications. The AXIS Ultra provides the latest in spectroscopic and imaging capabilities with analytical flexibility. Also being exhibited is the AXIS Nova, an automated XPS instrument combining research level performance with automation and high throughput. NREL's mission and strategy are focused on advancing the U.S. Department of Energy's and our nation's energy goals. The laboratory's scientists and researchers support critical market objectives to accelerate research from scientific innovations to market-viable alternative energy solutions.
OMICRON NanoTechnology is the premier supplier of UHV instruments for nanoscience-related research. We invite you to visit our booth to see the latest results from the next generation Low Temperature (down to 4K) Atomic Force Microscope with enhanced LHe hold time. The Variable Temperature AFM/STM is now available with a non-optical force sensor. We will also be highlighting the ESCA+, NanoESCA and NanoSAM surface science systems. From thin film development to characterization, Omicron can help. Physical Electronics (PHI) is a subsidiary of ULVAC-PHI, the world's leading supplier of surface analysis instrumentation. PHI’s innovative AES, XPS, and SIMS instruments are used to accelerate the development of advanced materials for a broad range of high technology applications. Thermo Electron Corporation will display the new K-Alpha Materials Characterization instrument. Using X-ray Photoelectron Spectroscopy (XPS), the K-Alpha enables rapid, accurate and cost-effective quantitative monitoring of the surface chemical composition of the top few nanometers of solid materials including insulators, semiconductors and metals for materials researchers as well as the emerging biotech, nanotech and pharmaceutical industries Vacuum Research Ltd: Manufacturer for 50 years of a broad line of high vacuum valves. Throttle valves, poppet style valves, rectangular port valves, and gate valves from ISO-63 to ISO-630. Valves with ANSI and JIS flanges in similar sizes.