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Deadlines

Housing: September 18, 2007
Symposium: September 24, 2007

 


 

technical program

Division Awards


Morton M. Traum Surface Science Division Student Award

The Surface Science Student Award was initiated in 1981. Morton M. Traum, then chair of the Surface Science Division, was the prime motivator in establishing the award. After Mort’s untimely death on 1 December 1982, the Executive Committee of the Surface Science Division renamed the award in his memory. The Morton M. Traum Surface Science Division Student Award is presented annually for the best student paper based on work leading to a Ph.D thesis. The papers are judged on technical content and quality of presentation.

The winner of the award will be announced at the beginning of the Postdeadline Discovery Session held on Thursday evening, November 16.

Past winners:

1981 Eric Stuve 1990 Benjamin Wiegand 1999 Jongin Hahn
1982 Steven Gates 1991 David Peale 2000 Anders Carlsson
1983 Ann Smith 1992 Chaochin Su 2001 Jeppe Vang Lauritsen
1984 Hans Gossman 1993 Anna Swan 2002 Seth B. Darling
1985 Duane Outka 1994 Bert M. Müller 2003 Marcel A. Wall
1986 Greg Sitz 1995 Frank Zimmerman 2004 Emrah Ozensoy
1987 Michael Henderson 1996 Joseph Carpinelli 2005 Jan Haubrich
1988 Jeff Hanson 1997 Barry Stipe 2006 Petro Maksymovych
1989 Yunong (Neal) Yang 1998 A. Bogicevic  

 


John Coburn and Harold Winters Student Award in Plasma Science and Technology

The Plasma Science and Technology Division has established the John Coburn and Harold Winters Student Award. John Coburn and Harold Winters have made pioneering contributions to the field of plasma processing and plasma surface interactions. Their work has provided the inspiration for countless students to enter the field. Coburn and Winters have enhanced the graduate experiences of students by both example and by tutorship. In recognition of their work, the Coburn and Winters Student Award will be conferred on the student whose oral presentation of his/her paper at the Annual Symposium is judged most outstanding by a panel selected from the Executive Committee of the PSTD. The student winner will receive a prize of $1,000.

Past winners:

1994 Bruce Kellerman 2001 Nicholas Fuller
1995 Not Given 2002 Lin Sha
1996 Jane Chang 2003 Jan Benedikt
1997 Mikhail Malyshev 2004 Jun Belen
1998 Catherine Labelle 2005 Joseph Végh
1999 Erwin Kessels 2006 Lin Xu
2000 Siva Kanakasabapathy  

MAJOR Symposium Sponsors
Ambios manufactures high performance, state-of-the-art, surface metrology equipment for industrial and academic researchers.  Product line includes  stylus profilometers, non-contact optical profilers, and  AFM and SPM instruments. JEOL manufactures a full line of surface analysis instrumentation including ultra high resolution TEMs for elemental analysis in sub-micron areas; scanning Auger Microprobes; ultra high resolution, low voltage, field emission SEMs and UHV SEMs; and UHV-STM’s featuring a high temperature sample heating stage. Kratos Analytical will exhibit its line of high performance XPS multi-technique spectrometers designed for R&D applications. The AXIS Ultra provides the latest in spectroscopic and imaging capabilities with analytical flexibility. Also being exhibited is the AXIS Nova, an automated XPS instrument combining research level performance with automation and high throughput. NREL's mission and strategy are focused on advancing the U.S. Department of Energy's and our nation's energy goals. The laboratory's scientists and researchers support critical market objectives to accelerate research from scientific innovations to market-viable alternative energy solutions.
OMICRON NanoTechnology is the premier supplier of UHV instruments for nanoscience-related research. We invite you to visit our booth to see the latest results from the next generation Low Temperature (down to 4K) Atomic Force Microscope with enhanced LHe hold time. The Variable Temperature AFM/STM is now available with a non-optical force sensor. We will also be highlighting the ESCA+, NanoESCA and NanoSAM surface science systems. From thin film development to characterization, Omicron can help. Physical Electronics (PHI) is a subsidiary of ULVAC-PHI, the world's leading supplier of surface analysis instrumentation.  PHI’s innovative AES, XPS, and SIMS instruments are used to accelerate the development of advanced materials for a broad range of high technology applications. Thermo Electron Corporation will display the new K-Alpha Materials Characterization instrument. Using X-ray Photoelectron Spectroscopy (XPS), the K-Alpha enables rapid, accurate and cost-effective quantitative monitoring of the surface chemical composition of the top few nanometers of solid materials including insulators, semiconductors and metals for materials researchers as well as the emerging biotech, nanotech and pharmaceutical industries Vacuum Research Ltd: Manufacturer for 50 years of a broad line of high vacuum valves. Throttle valves, poppet style valves, rectangular port valves, and gate valves from ISO-63 to ISO-630.  Valves with ANSI and JIS flanges in similar sizes.