                  |
|
IMPORTANT DeadlineS |
|
Housing: Oct. 20, 2006 |
| Registration: Oct. 23, 2006 |
ASTM-E-42
Plenary Talk Abstract
Curve
fitting is an increasingly important aspect of surface analysis that can be
very confusing to many scientists new to surface spectroscopy. This workshop
will provide an overview of data analysis methods that can be used in
surface analysis, especially those that can be used in x-ray photoelectron
spectroscopy (XPS). Workshop presentations will provide illustrations of the
application of data analysis methods to real systems, and discusses
practical problems that can arise when working with real data sets. The
workshop will focus upon curve fitting of core XPS data, and discusses the
importance of combining curve fitting information with other supporting
information and experiments. The effect of different backgrounds
incorporated into the fitting process will be discussed. The workshop will
involve real time processing of data. Those attending the workshop with a
“windows” based laptop computer will be provided with a software package to
work on specific data analysis examples such as those described in Peter M.
A. Sherwood “Curve fitting in surface analysis and the effect of background
inclusion in the fitting process” J. Vac. Sci. Technol. Vol. 14 (1996)
1424-1432.
|
