AVS Rocky Mountain Chapter Short Course Program September 20-23, 2011
Course: Fundamentals of Vacuum Technology
Course Objectives
Part I-Concept/calculations/gauging/pumps Part II-Materials, valves and other components, system design considerations and maintenance
Instructors: Timothy Gessert is a Senior Scientist and leader of the CdTe Research Team at the National Renewable Energy Laboratory (NREL) in Golden, Colorado. He received degrees in physics from the University of Wisconsin-River Falls (B.S.), Colorado School of Mines (M.S.), and University of Wales-College of Cardiff (Ph.D.) His more than 15 years of research experience at NREL have involved development of vacuum and photolithographic processes for the fabrication of transparent-conducting oxides, photovoltaic absorber layers, and electrical contact. He is currently working toward development of environmentally stable contacting systems for thin-film CdTe-based photovoltaic devices. He has published more than 70 papers and currently serves on the board of the Rocky Mountain Chapter of the AVS.
Neil Peacock is a Development Engineer for the HPS Division of MKS Instruments, Inc., in Boulder, Colorado. In over 10 years with HPS, his responsibilities have included the design, testing, characterization, and calibration of thermal conductivity gauges and ionization gauges. He has helped in the training of HPS employees in vacuum technology and has presented invited and contributed papers on vacuum gauging. He received a bachelor’s degree in physics from the University of Colorado. He is currently a member of the Board of Directors of the AVS Vacuum Technology Division and is chair of the AVS Recommended Practices Sub-Committee on Ionization Gauges. Course Materials: Course notes
Cost: Part I: $900; Students: $300 Parts I & II: $1500; Students: $600
Course: Vacuum System Troubleshooting—Leak Detection and Hardware Issues Affecting Performance Course Objectives
Review vacuum fundamentals necessary to undertake effective leak detection
Understand the effects of leaks on typical vacuum processes
Review typical vacuum leak detection procedures including probing, sniffing and bombing
Understand how to tell the difference between real and virtual leaks.
Understand procedures for addressing vacuum leaks
Learn how to specify vacuum leak detection equipment
Understand how material choices and operational processes can impact leaks and system performance.
Learn options if a leak is not found, but system performance is substandard
Learn possible hardware causes of poor/unacceptable performance
Instructor: Neil Peacock
Course Materials: Course notes
Cost: $575; Students $150
Course: Characterization of Thin Films
Course Objectives:
Know various techniques to characterize thin film materials.
Learn imaging techniques such as optical microscopy, SEM, TEM and AFM.
Learn structural and chemical properties such as XRD, profilometry, QCM and AES; EDAX, XPS/ESCA, SIMS and RBS.
Understand and discuss electrical/magnetic properties
Understand and discuss mechanical properties
Instructor: Tom Christensen is a Professor of Physics at the University of Colorado at Colorado Springs. He is presently the chair of the national Education Committee of the AVS. He received his B.S. in physics from the University of Minnesota in 1979 and his M.S. and Ph.D. degrees in Applied Physics from Cornell University. After several years as a member of the technical staff at Sandia National Laboratories in Albuquerque he joined the University of Colorado faculty in 1989. He has worked with vacuum technology, thin film technology and surface characterization since 1980 and has taught local AVS short courses since 1992.
Course: Reactive Sputtering & Deposition
Instructor: Joe Greene is the D.B. Willett Professor of Materials Science and Physics at the University of Illinois and the Tage Erlander Professor of Materials Physics at Linköping University, Sweden. The focus of his research has been the development of an atomic-level understanding of adatom/surface interactions during the dynamic process of vapor-phase crystal growth in order to controllably manipulate nanochemistry, nanostructure, and, hence, physical properties. His work has involved nanotechnology and film growth by all forms of sputter deposition, solid and gas-source MBE, UHV-CVD, MOCVD, and ALE. Joe has published more than 500 papers and review articles, 22 book chapters, and co-edited 4 books in the general areas of crystal growth, thin-film physics, and surface science. He is currently Editor-in-Chief of Thin Solid Films and past Editor of CRC Critical Reviews in Solid State and Materials Sciences. Joe is active in the AVS where he has served on the Trustees, twice as a member of the Board of Directors, as President of the society in 1989, and is currently Secretary.
Major awards include: the AVS John Thornton Award (1991), the Tage Erlander Award (1991) from the Swedish Natural Science Research Council, Fellow of the American Vacuum Society (1993), Technical Excellence Award from the Semiconductor Research Corporation (1994), 1996 DOE Award for Sustained Outstanding Research, 1998 David Adler Award in Materials Physics from the American Physical Society, 1998 Aristotle Award from SRC, Fellow of the American Physical Society (1998), AVS Distinguished Lecturer (1998-present), David Turnbull Award form the Materials Research Society (1999), 2001 International Scientist of the Year, Elected to the European Academy of Science in 2002, and Elected to the US National Academy of Engineering in 2003.
Course: Sputter Deposition
Instructor: Joe Greene
Cost: $850; Students $300
Course: Thin Film Nucleation, Growth & Microstructural Evolution Course Objectives: