Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2014)
    Thin Films Wednesday Sessions
       Session TF-WeP

Paper TF-WeP23
Application of Double-Lorentzian Line-Shape in XPS Analysis of Metallic Zn and ZnO Thin Films.

Wednesday, December 10, 2014, 4:00 pm, Room Mauka

Session: Thin Films Poster Session
Presenter: Gabriela Molar-Velazquez, CINVESTAV-Unidad Queretaro, Mexico
Authors: G. Molar-Velazquez, CINVESTAV-Unidad Queretaro, Mexico
G. Gomez-Sosa, CINVESTAV-Unidad Queretaro, Mexico
A. Herrera-Gomez, CINVESTAV-Unidad Queretaro, Mexico
Correspondent: Click to Email

There are several line-shapes widely employed in XPS spectra analysis, such as Gaussian, Lorentzian, Voigt, Doniach-Sunjic, among others. In the case of transition metals, the high asymmetry present in the main core levels peaks might lead to misinterpretation as considering artificial peaks during fitting. Some of this problems could be avoided by employing the double-Lorentzian line-shape. In this study, analysis of XPS spectra of Zn and ZnO films (including the early oxidation stages at room temperature) were performed using double-Lorentzian line-shape. The chemical composition of ZnO samples were calculated and different peaks for the metallic Zn 2p, Zn 3p, Zn 3s and Zn 3d core levels were identified.