Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2014)
    Thin Films Wednesday Sessions
       Session TF-WeP

Paper TF-WeP12
A Study of the Mechanical Properties of Trench Type Cu/Mo Thin Films for Flexible Copper Interconnect

Wednesday, December 10, 2014, 4:00 pm, Room Mauka

Session: Thin Films Poster Session
Presenter: JongHyun Seo, Korea Aerospace University, Republic of Korea
Authors: J.H. Seo, Korea Aerospace University, Republic of Korea
H.-S. Kim, Korea Aerospace University
HH. Choe, Korea Aerospace University, Republic of Korea
J.-H. Jeon, Korea Aerospace University, Republic of Korea
J.H. Yoon, Korea Aerospace University, Republic of Korea
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In this work, the adhesion properties sputtered molybdenum (Mo) thin films as a copper (Cu) diffusion barrier layer on polymer substrates were examined using micro-scratch tests. We fabricated trench type copper interconnect rather than typical metal inlaying type.

There was made a comparison of the mechanical properties between a new trench copper layer and a traditional metal inlay type copper interconnect by means of photolithography technique followed by wet patterning. The metal / polymer interface were examined by using the auger electron spectroscopy. Cu/Mo trench typed films have 50% higher values of adhesion forces than that of Cu/Mo inlay type. A physical modeling is proposed, on average volume stress analysis to explain an improvement in the mechanical stability of the buried Cu interconnects in the flexible substrate.