Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2014)
    Thin Films Tuesday Sessions
       Session TF-TuP

Paper TF-TuP37
P3HT-based Multilayer Ultrathin Films Characterized with Surface-Sensitive X-Ray Scatterings –temperature and substrate dependence of crystalline structure-

Tuesday, December 9, 2014, 4:00 pm, Room Mauka

Session: Thin Films Poster Session
Presenter: Yusuke Shima, Kwansei Gakuin University, Japan
Authors: Y. Shima, Kwansei Gakuin University, Japan
R. Iseiki, Kwansei Gakuin University, Japan
J. Takemoto, Kwansei Gakuin University, Japan
I. Takahashi, Kwansei Gakuin University, Japan
Correspondent: Click to Email
Regioregular poly(3-hexylthiophene) (P3HT) has attracted significant interest as one of the promising materials for organic field effect transistors (OFETs) and organic photovoltaics (OPV) to behave a p-type semiconductor with high charge mobility due to its high crystallinity. The organic thin film devices basically consist of conductive polymer films and insulating polymer films. However, maintaining well-defined interface structures is difficult when the temperature of confined system is raised by Joule’s heat. Therefore, any information on temperature dependence of interface structure of organic thin films is very important for applications. We study molecular chain orientations, crystallinity and surface morphology of P3HT thin films prepared on several different substrates at high temperatures with grazing incident X-ray diffraction (GI-XD), X-ray reflectivity (XRR), grazing incident wide angle X-ray scattering (GI-WAXS) and atomic force microscopy(AFM). The substrate we have investigated are SiOH, SiO2, C surface of SiC(0001) and Si surface of SiC(0001), and poly(4-vinylphenol) (PVPh). We found that substrate greatly affects the crystal growth of P3HT even for films thicker than 25 nm. Keywords: Poly(3-hexylthiophene) (P3HT), X-ray surface scattering, thin film, conductive polymers