| Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2014) | |
| Nanomaterials | Tuesday Sessions |
| Session NM-TuE |
| Session: | Nanomaterials Characterization & Reactivity II |
| Presenter: | Miguel Jose Yacaman, University of Texas San Antonio, USA |
| Correspondent: | Click to Email |
Electron Microscopy methods to characterize Thin films and interfaces have advanced very substantially during the last decade.In particular two methods are some of the most significant : Aberration corrected TEM-STEM images and Precession Electron Diffraction.In this paper we describe this methods and apply them to the characterization of gold thin films. It is possible to obtain atomic images of the interfaces using STEM-HAADF which yield realiable information about the atomic positions .When we combine this with single grain diffraction we can obtain a very complete description of the grain structure.
We present the case of polycrystalline Gold thin films grown at different temperatures.We discuss the distribution of most likely boundaries present and its frecuency as a function of the temperature .In addition by using STEM-HAADF it is possible to obtain the surface topography evolution as function of the temperature.