AVS Greater New York Chapter 

The Greater New York Thin Film Chapter was formed in 1966. In 1970, the Chapter asked the Board to approve a name change to “Thin Film and Surface Science Society; Chapter, Thin Film Division, AVS” but this was denied because it would have been one society within another society. 

From 1971, under the new organizational structure, the Greater New York Chapter was within the New York-Delaware Valley RAG, which covered the area of New York, New Jersey, part of Connecticut, Pennsylvania, West Virginia, Delaware, and part of Maryland. The Greater New York Chapter area covered New York and parts of New Jersey and Connecticut. New York (zips 10001-11999, 12401-12603), New Jersey (Princeton-Asbury Park and north), and Connecticut (zips 06807-06903). In 1974,  the Upstate New York Chapter was formed.

In 2002, the Greater New York Chapter was dissolved and members (zips 10500-10999 and 12000-14999, which includes Westchester County and all points north) were assigned to the Upstate New York Chapter; members in Connecticut were assigned to the New England Chapter; the remainder were assigned to the Delaware Valley Chapter.

Chairs of the Greater New York Thin Film Chapter and the Greater New York Chapter

The Chapter and the Delaware Valley Section held a joint Symposium  "The  Practical Aspects of Vacuum and Thin-Film Technology”, on 16 May, 1968, at the RCA Laboratories, Princeton, New Jersey.  

The Greater New York Chapter of the Thin Film Division, at their May 15, 1969 meeting, installed the following officers for 1969-70:

Chairman, R. B. MARCUS, Bell Labs; Vice-Chairman, B. H. Vromen, IBM; Secretary-Treasurer, W. E. LOEB, Union Carbide; Program Chairman, P. BEAUDOUIN, IBM; Membership Chairman, J. D. LEVINE, RCA; Publicity Chairman, C. C. CHANG, Bell Labs.; and Committee Members-at-Large, P. MARK, Princeton Univ., A. E. FEUERSANGER, GT&E, and S. MADER, IBM.

Dinner Meetings were held in Lyndhurst, NJ featuring the following speakers:

Sept. 23, 1969

Prof. N. Klein, Bell Labs., ELECTRIC BREAKDOWN IN OXIDES.

Prof. Zvi Meiksin, Univ. of Pittsburgh, EFFECT OF APPLIED STRAIN ON RESISTANCE OF METALLIC THIN FILM DURING NUCLEATION AND GROWTH.

Nov. 19, 1969

Prof. E. W. Mueller, Pennsylvania State Univ., PROBLEMS OF QUANTITATIVE FIELD ION MICROSCOPY.

Dr. Oliver Wells, IBM, SPECIAL TECHNIQUES IN SCANNING ELECTRON MICROSCOPY.

A HISTORY OF THE GREATER NEW YORK CHAPTER (THIN FILMS)
OF THE AMERICAN VACUUM SOCIETY