Symposium Chairs

Christina Scheu, University of Munich, Germany, Christina.Scheu@cup.uni-muenchen.de
Peter Schaaf, Ilmenau Unviversity of Technology, Germany, peter.schaaf@tu-ilmenau.de
Finn Giuliani, Imperial College, United Kingdom, f.giuliani@imperial.ac.uk

This topical symposium focuses on the advanced characterization of coatings and thin films that enables an understanding of growth and surface modification processes as well as fundamental structure-property-processing relationships. This may led to optimization of processing and properties of coatings and thin films. Contributions are of interest that either highlight the application of, or draw attention to, recent advances in analytical methods and characterization techniques including numerical evaluation and quantification procedures (e.g. factor analysis, depth profiling, etc.) to reveal the micro- and nano-structure, chemical composition, chemical states and phases of coatings, thin films, interfaces, and surfaces during or after surface modification. Phase characterization, surface topography probes, compositional analysis, high spatial imaging and analysis, hardness and functional properties (optical, PL, CL, magnetic, etc) measurements continue to be subjects of interest in this symposium.

The focus is on recent developments in new characterization methods and established techniques for microstructural characterization by spectroscopy and imaging, with emphasis on surfaces, interfaces thin films and coatings. Methods include but are not limited to STM/AFM, nanoindenter, EPMA, XRD, grazing X-ray reflectivity (GIXRR), medium energy ion scattering (MEIS), AES, XPS, EELS, SIMS, TOFSIMS, RBS, XRF, atom probe measurements and other spatially resolved imaging and elemental mapping techniques such as focused ion beam (FIB) microscopy, scanning electron microscopy (SEM) and transmission electron microscopy (TEM), electron energy-loss spectrometry (EELS) and energy-dispersive spectrometry (EDS). Of particular interest are in situ characterization methods.  

Proposed Invited 

Hans Arwin (Linköpings Universitet): Ellipsometry

Martin Ritter (Cambridge): 3D – microscopy

Martin Hytch (Toulouse) : Strain mapping of thin films

. . . . . . . . . . . . . . . . . . . . . . . . . . .

Technical Symposia:

A. Coatings for Use at High Temperature

B. Hard Coatings and Vapor Deposition Technology

C.Fundamentals and Technology of Multifunctional Thin Films

D. Biomedical Coatings

E. Tribology and Mechanical Behavior of Coatings and Thin Films

F. New Horizons in Coatings and Thin Films

G. Applications, Manufacturing, and Equipment

.

Tutorial Sessions:

TS1. Computational & Experimental Studies of Thin Film Growth: An Atomistic View

TS2. Coatings for Fuel Cells & Batteries

TS3. Surface Engineering for Thermal Transport, Storage and Harvesting

TS4. Characterization: Linking Synthesis, Properties and Microstructure

TS5. Energetic Materials and Micro-Structures for Nanomanufacturing