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Symposium Chairs
Peter
Schaaf,
TU Ilmenau, Germany,
peter.schaaf@tu-ilmenau.de This symposium focuses on recent advances in the characterization of coatings and thin films, which enforces an understanding of the growth and surface modification processes as well as fundamental structure-property-processing relationships. Contributions are of interest that either highlight the application of, or draw attention to, recent advances in analytical methods and characterization techniques including numerical evaluation and quantification procedures (e.g. factor analysis, depth profiling, etc.) to reveal the micro- and nano-structure, chemical composition, chemical states and phases of coatings, thin films, interfaces, and surfaces during or after surface modification. Phase characterization, surface topography probes, compositional analysis, high spatial imaging and analysis, and hardness measurements continue to be subjects of interest in this Symposium. The focus is on recent developments in new characterization methods as well as established techniques with new applications for microstructural characterization by spectroscopy and imaging, with emphasis on surfaces, interfaces, thin films and coatings. Methods include, but are not limited to, STM/AFM, EPMA, XRD, grazing X-ray reflectivity (GIXR), medium energy ion scattering (MEIS), AES, XPS, EELS, SIMS, TOFSIMS, RBS, atom probe measurements and other spatially resolved imaging and elemental mapping techniques such as focused ion beam (FIB) microscopy, scanning electron microscopy (SEM) and transmission electron microscopy (TEM), electron energy-loss spectrometry (EELS) and energy-dispersive spectrometry (EDS). Of particular interest are in situ characterization methods. Invited Speakers Frank Mücklich, Saarland University, DE, “3D Materials Analysis for Coatings and Thin Films” Suneel Kodambaka, UCLA, USA, “In Situ High Temperature STM of Surface Reactions” . . . . . . . . . . . . . . . . . . . . . . . . . . .
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