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tutorials
(FREE TO ICMCTF ATTENDEES)
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Dr. Arutiun P. Ehiasarian
Sunday, April 27, 2008, 5:30 -
7:30 pm The tutorial will start with plasma and discharge parameters in HIPIMS and will discuss the origins of high ion fluxes and high degree of metal ionisation found in the plasma. Emphasis will be placed on the application of HIPIMS for the pretreatment of substrates to improve adhesion and for coating deposition. The mechanisms for improved adhesion after HIPIMS pretreatment will be discussed and compared with other technologies such as Ar glow discharge, cathodic arc, and filtered cathodic arc. The development of coating microstructure and properties in HIPIMS conditions will be described. Examples of monolayer and nanoscale multilayer coatings and performance in wear, corrosion, and oxidation environments will be given.
TUTORIAL Stress and Strain in Polycrystalline Thin Films
Guido Janssen
Sunday, April 28 2008, 5:30 –
7:00 pm Polycrystalline thin films on substrates usually are in a “stressed” state. In the presentation the two main methods for stress measurements, wafer curvature and X-ray lattice parameter measurements will be presented. Special attention will be given to the information that can be obtained by applying both techniques. This discussion will be followed by a discussion of recent results on stress in hard polycrystalline films. For Cr and CrN films, it has been shown that the stress is not uniform over the thickness of the film. High tensile stresses are observed near the substrate-film interface. Lower tensile stresses are observed further away from the interface. Moreover, it has been shown that the tensile stress is generated at the grain boundaries. In the case for which the deposition of the film is accompanied by an ion bombardment, a compressive stress is generated. The tensile- and compressive stresses in these films are independent and additive.
This description, however, does not hold for all
high melting point films, notably not for TiN. For TiN higher compressive
stresses are observed close to the substrate-film interface. This intriguing
difference between CrN and TiN will be discussed. FOCUSED TOPIC SESSIONS
k-SPACE
Prof. Eric Chason
Monday, April 28, 2008, 12:15
– 1:15 pm Studying the real‑time evolution of stress in thin films using wafer curvature We will discuss the principles of measuring film stress with a multi‑beam optical curvature technique (MOS) that can be used in situ and in real‑time. Examples from a number of different materials systems and deposition methods (evaporation, CVD, sputtering, electro-deposition) will illustrate how the measurements can be used to determine the fundamental processes controlling stress evolution. VISIT BOOTH # 43 & 44 FOCUSED TOPIC SESSION
Hysitron David
Vodnick
Monday,
April 28, 2008, 12:15 – 1:15 pm
Recent trends in the miniaturization of devices and
increasing demands for high- performance materials continue to dictate a change
in the way materials are characterized. Understanding the structure, properties,
and role of processing at the nanoscale is crucial to achieving the desired
performance, regardless of the size scale of the final product. Nanomechanical
characterization is a relatively new solution for materials testing, expanding
on the range of traditional hardness testing. Nanomechanical testing techniques
provide superior lateral and vertical resolution, allowing for a high spatial
resolution acquisition of surface properties and the ability to reliably target
individual phases/features on a sample surface. This tutorial will cover
nanoscale mechanical and tribological property measurements, in addition to the
newly developed conductive and in-situ TEM nanoindentation techniques. ICMCTF 2008 FORUM A Scientific Perspective on the Energy Challenge Neal D. Shinn
DOE Center for Integrated
Nanotechnologies
Monday,
April 28, 2008, 4:50 – 6:00 pm
This session focuses on imminent research challenges of industrial applications. The environmental impact of increasing energy use worldwide and the challenge of ensuring a sustainable energy supply have become hot topics in the news. The obvious need for new energy technology options has stimulated increased scientific interest in the underlying issues such as energy transfer and energy storage, with the expectation that fundamental science breakthroughs will lead to advanced materials with superior performance. But given the broad range of relevant materials research, what are the greatest needs and opportunities for impact? This presentation will summarize published assessments of the energy challenge (supply and environmental impact aspects) and highlight materials research needs to meet these challenges. This will serve as a context for the subsequent panel discussion of various promising approaches and recent advances. This work was performed, in part, at the Center for Integrated Nanotechnologies, a U.S. Department of Energy, Office of Basic Energy Sciences user facility operated jointly by Los Alamos and Sandia National Laboratories. Sandia National Laboratories is a multi-program laboratory operated by Sandia Corporation, a Lockheed-Martin Company, for the U. S. Department of Energy under Contract No. DE-AC04-94AL85000. FOCUSED TOPIC SESSION VAMAS TWA22 Mechanical Property Measurements of Thin Films and Coatings
Nigel Jennett
Monday, April 28, 2007, 5:30 -
6:30 pm
This session combines quo vadimus style discussion with the generation and reporting of co-operative action. All are warmly welcomed, especially those interested in co-operative action to generate data that would support new methods and standards in this field. The session will also act as the Annual General Meeting of VAMAS Technical Working Area 22 and will include a progress report on Project 4: Measurement of Super Hard Coatings by Instrumented Nano-Indentation. VAMAS Technical Working Area 22 addresses pre-standardization needs in the general area of test method development and evaluation for the measurement of the mechanical properties of small volumes of materials, in particular thin films and coatings on substrates. Activities cover nano-mechanical measurement methods to determine the mechanical properties of surfaces, and the films or coatings themselves, as well as larger scale test methods to evaluate the performance of coating/substrate systems as a whole. Membership is open to all and the adopted activities are those which attract sufficient partners willing to work together for the common goal. FOCUSED TOPIC SESSION Bruker New Developments in XRD Characterization on Thin Film Materials
Dr. Ning Yang
Wednesday,
April 30, 2008, 12:15 – 1:15 pm Thin films and coatings have become more and more important in the materials research and applications. X-ray diffraction and X-ray fluorescence are premier methods in characterization of this type of materials as they are non-destructive, yet providing ample information on the specimens. With the new technologies developed on X-ray instrumentation, the characterization is now even faster and more accurate. In this lunch time tutorial session, the common characterization methods for thin films with X-ray will be covered with examples. The new development of hardware and software from Bruker AXS Inc. will be introduced as well. VISIT BOOTH #51 FOCUSED TOPIC SESSION CSM INSTRUMENTS Scratching More Than the Surface: Using Scratch Testing in Innovative Ways
Dr. Nicholas Randall
Wednesday,
April 30, 2008, 12:15 – 1:15 pm CSM Instruments has been a leader in instruments for surface mechanical properties testing for many years, especially in the field of scratch testing where the adhesion of a coating or its scratch resistance is measured by moving an indenter across the surface in a controlled manner. Recent strides in standardization, namely ISO 20502, JIS R3255 and ASTM C1624 have brought the scratch test into the industrial Quality Control (QC) arena, where ease-of-use, reproducibility and automation are the most important requirements of the test. In its continued commitment to this field, CSM Instruments has developed a range of scratch testers which suit all thin film and coating applications. The objective of this tutorial is to introduce the method, show typical application examples and then focus on the additional features of the system which make these instruments a valuable tool for evaluating coating adhesion, integrity, frictional properties, viscoelastic relaxation and internal stress. We shall also be presenting for the first time, the new Panoramic ModeTM which allows the entire scratch to be recorded optically (with infinite focus) and correlated exactly to the scratch data set, meaning that critical failure points can be evaluated at any time after the test has been completed. For users that build up a database of scratch test results on many different coating formulations, this innovative feature allows a complete record of each test, as well as a means of going back to old data and accurately reevaluating it at any time. VISIT BOOTH #48 TUTORIAL Art and Skills of Successful Scientific Manuscript Preparation R.L. BOXMAN
Tel Aviv University The objective of the tutorial is to present to the participants a recipe for organizing and writing good scientific papers. The critical elements of each section of the “research report” will be reviewed, and content, organization, and style conventions will be discussed. In the Introduction, the importance of a clear gap sentence and statement of purpose will be emphasized. The requirement for providing sufficient detail for duplicating results elsewhere in the Experimental Details section will be explained. The proper order for presenting Results – location, presentation, and comment - will be explained. The principle of heads-up display in technical drawings will be explained. The need to differentiate between results and interpretation will be emphasized. The organization of the discussion, from narrow comments to broad implications will be presented and appropriate language and interpretation of the relative certainty of explanations, i.e. from speculation to proof, will be explained. Summarizing the key results and their implications in terms of 3 points the author wishes the reader to remember will be suggested as the organizational mode for the Conclusions. The difference between an indicative and an informative Abstract will be explained, as well as the need for the latter. Finally, suggestions for interacting with journal editors and responding to reviewers’ comments will be presented.
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