The 2017 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN) will be held at the Monterey Marriott in Monterey, CA, March 21-23, 2017.
The FCMN will bring together scientists and engineers
interested in all aspects of the characterization
technology needed for nanoelectronic materials and
device research, development, and manufacturing. All
approaches are welcome: chemical, physical, electrical,
magnetic, optical, in-situ, and real-time control and
monitoring. The conference will summarize major issues
and provided critical reviews of important semiconductor
techniques needed as the semiconductor industry moves to
silicon nanoelectronics and beyond.
"There were a total of 34 talks
and 81 poster presentations that summarized major issues
and provided critical reviews of crucial semiconductor
developments and techniques needed as the industry
evolves to silicon nanoelectronics and beyond."
"If you want to meet, greet,
and learn from the world's experts in metrology, this is
the place to be."
Program Committee and Chairs
Conference Information and Office