Natural Radiation Environments and their Effect on Semiconductor Devices
Dr. Robert Baumann
TI Fellow Aerospace and Defense Product Group
Dallas, TX
ABSTRACT:
It may be hard to believe that subatomic nuclear events can gravely effect our lives,
but soft errors, or more specifically, single event effects (SEEs) caused by a solitary
alpha particle or neutron event can actually limit the ultimate reliability of advanced
semiconductor technologies in the terrestrial environment. We also consider the much harsher
space radiation environment, where in addition to mitigating SEEs, electronics must be robust
against dose effects that can lead to permanent device failures. We conclude with a discussion
of many of the solutions that have been used to varying degrees to harden commercial electronics
in terrestrial applications and to ensure low-failure rates in spacecraft electronics.
BIO:
Robert Baumann received a B.A. in Physics (cum laude, ‘84) from Bowdoin College and a Ph.D.
in Electrical Engineering from Rice University (‘90). He joined Texas Instruments in 1989
where he discovered that the reaction of 10B with low-energy neutrons from the cosmic-ray
background was responsible for the majority of reliability failures in most digital
electronics. From 1993-1998 he worked in TI Japan on semiconductor reliability and created
an advanced PFA/EFA group providing critical analyses for solving high-profile manufacturing
problems. Robert returned to TI Dallas in 1998 where he focused on radiation effects.
He co-led the SIA panel expert panel directly responsible for 2007 changes to ITAR that
reduced the risk of U.S. commercial electronics becoming inadvertently export controlled.
He was the one of the main authors and leader of the group that created the JEDEC (JESD89, 89A)
industry standard for radiation testing of commercial microelectronics. Robert is currently
a TI Fellow in the Aerospace and Defense Product Group, focused on radiation effects and the
development of a new FRAM optimized for harsh environments.
He is an IEEE Fellow and has authored/coauthored > 80 papers,
two book chapters, and nine U.S. patents with several more pending.