In-Situ Electron Microscopy (IE): The topical conference provides a forum for new and exciting electron microscopy based techniques and research opportunities that are and will be available for fundamental studies of material synthesis, properties, and device characteristics at the nanoscale. The general theme of this symposium will be high-resolution in-situ TEM for fundamental studies.

 

We stand at the beginning of a new era for electron microscopy, where aberration-corrected microscopes will enable high spatial, temporal, and spectral resolution to coexist with macroscopic experimental modules. These microscopes allow unique in-situ experiments to study structure/property, stimuli/response, and related dynamic processes at or near atomic/molecular resolution. Use of the existing in-situ microscopy techniques, with limited resolutions, have already resulted in significant progress in fields as diverse as surface physics, strength of materials, epitaxial growth, and catalytic reactions to name a few.

 

The organizers of this topical conference seek to bring together a broad coalition of scientists, both among and outside the electron microscopy community, and provide a forum to discuss the scope of the next generation of TEM in-situ materials science experiments. This discussion will help identify specific areas of materials research where the capabilities of the new instruments might enable scientific breakthroughs.

 

IE1 In-situ Electron Microscopy

U. Dahmen, Lawrence Berkeley National Laboratory

J.M. Howe, University of Virginia

B. Kabius, Argonne National Laboratory

E. Olsson, Chalmers University of Technology, Sweden

I. Robertson, University of Illinois, Urbana-Champaign

R. Sharma, Arizona State University

E. Stach, Purdue University

S. Takeda, Osaka University, Japan, “In-situ Environmental TEM of the Nucleation and Growth of One-Dimensional Nanostructures”

J.M. Zuo, University of Illinois, Urbana-Champaign