The Applied Surface Science Division (AS) features sessions related to a variety of applied topics and analysis methods for materials of technological interest. Several sessions will focus on important emerging fields in applied surface science, such as functional soft materials, biomaterials, and surface functionalized nanoscale materials. Contributions for these sessions could include the areas of photonics/plasmonics, biological imaging, sensing and microfluidics. Contributions addressing the development of novel characterization methods in these emerging fields are especially encouraged. Several sessions will focus on the application and development of surface characterization and data/image processing methods carried out both inside and outside of vacuum. Contributions for these sessions could include optical, atom and scanning probe methods, and tomography, together with the traditional methods of surface analysis. A two session program concentrating on Quantitative Surface Analysis, will honor the contributions of Martin Seah, NPL, and Cedric Powell, NIST. An Aspects of Applied Surface Science poster session will be offered.

AS1+BI+NS  Fabrication and Characterization of Functional Soft Material Surfaces

P.V. Braun, University of Illinois at Urbana-Champaign, "Patterning and Characterization of Two and Three Dimensional Structures for Control of Chemical and Photonic Transport"

AS2+BI+NS  Surface Analysis and Related Methods for Biological Materials

D.W. Moon, Korea Research Institute of Standards and Science, "Nano-bio Chemical Image of Single Cells and Tissues for BioMedical Applications"

AS3+NS  Understanding Surface Functionalized Nanoscale Materials

P.T. Lillehei, NASA Langley Research Center, "Critical Issues Concerning the Use of Nanomaterials in Aerospace Platforms"

AS4       3-Dimensional Characterization

  C.F. Kisielowski, Lawrence Berkeley National Laboratory, “Prospects for Electron Tomography with Atomic Resolution”

AS5       Chemical Imaging at High Spatial Resolution

  P.S. Weiss, The Pennsylvania State University

AS6       Quantitative Surface Analysis I. Electron Spectroscopies: (Honoring the contributions of Martin Seah,   NPL, and Cedric Powell, NIST)

  C. Powell, National Institute of Standards and Technology, “Some Highlights and New Directions in Quantitative AES and XPS”

  M.P. Seah, National Physics Laboratory, UK “Cluster Primary Ions: Sputtering Yields, Secondary Ion Yields and Inter-Relationships for Secondary Molecular Ions for Static SIMS”

AS7       Quantitative Surface Analysis II. Ion Spectroscopies: Honoring the Contributions of Martin Seah, NPL, and Cedric Powell, NIST

AS8+SS  Ambient Surface Analysis

  C.M. Eggleston, University of Wyoming, "In-situ Surface Analysis by Optical Means"

AS9       Aspects of Applied Surface Science Poster Session